Semight-News-Company Updates-Semight Instruments

Semight meets you at CIOE in Shenzhen on Sep 11 ~ 13

2024.08.25

CIOE is a leading exhibition for optoelectronics industry, covering optical communications, precision optics, lasers, smart manufacturing, and new display technology and so on.

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Semight Debuts at IPF 2025, Showcasing "Lab to Fab" SiC Testing Solutions

2024.08.25

On August 21–22, the 3rd International Power Device Manufacturing, Testing & Application Conference (IPF 2025) was held in Wuxi.

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Semight showcases leading testing equipment to meet you at SEMICON TAIWAN 2024.

2024.08.18

At the SEMICON Show, we will showcase our cutting-edge solutions, including PB6600 SiC KGD Test System, WLBI3800 Wafer Level Burn-In System, and PLR0010 Package-Level Reliability Test Equipment.

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Semight "Favoured" by Visitors at electronica china

2024.07.11

The electronica china 2024 comes to a happy ending. Thanks to more than 200 visitors who showed up at our booth. We expect to see you again next year!

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Welcome to electronica China 2024! Semight, with its high precision SMU, is ready!

2024.07.02

electronica China 2024 will be held on July 8-10, 2024 at the Shanghai New International Expo Center.

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Semight in the spotlight at the show

2024.06.17

As the world's largest electronics and power supply chain event, PCIM Europe has a strong influence in the industry, and the exhibitions, technical forums, academic conferences,

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Semight presents the latest SiC KGD Test System at PCIM Europe

2024.05.29

Semight Insturments will showcase the latest semiconductor equipments including SiC KGD PB6600 test system, WLBI3800 Wafer-Level Burn-In system and WAT6300 High-Voltage Serial Parameter test system during the exhibition! Welcome！

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Semight presents the latest semiconductor test systems at SEMICON SEA!

2024.05.17

Semight is going to showcase the latest SiC KGD test system PB6600, Wafer-Level Burn-In system WLBI3800, High-Voltage Serial Parameter Test System WAT6300 during the event.

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Semight Invited to Present at the 3rd International Forum on Compound Semiconductors in Taiwan

2024.04.30

On 25th April, the 3rd International Forum on Compound Semiconductors, jointly organised by the Taiwan Electronic Equipment Association (TEEA) and the College of Engineering of National Taiwan University (NTU), came to a successful conclusion at the Nanga

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