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High Speed Transceiver ATE

MTP8104

800G Quad-Port Optical Transceiver Tester


Semight MTP8104 is a comprehensive Bit Error Rate Analysis system which integrates multi-channel Bit Error Rate Tester, multi-port MCBs to host optical transceiver, and multi-channel independent temperature control units, making it ideal for mass-produced testing of high-speed 400G/800G optical transceiver across various ambient thermal cycle settings.

Features

  • Flexible Application

    Wide Data Rate Range: 24.33~56.4 GBaud
    Independent Control: Each channel can be independently configured with NRZ/PAM4, amplitude and equalization
  • Comprehensive Capabilities

    Supports PCS hardware layer's FEC error correction analyzer
    Supports ultra-fast and high-precision BER sampling (<10ms)
  • Excellent Signal Quality

    Rapid rise and fall time, low intrinsic jitter
  • Rich Test Patterns

    PRBS7~31Q; SSPRQ /JP03A /JP03B /LIN /Square wave/Custom defined patterns, etc.
  • High Efficiency

    Low cost and high efficient three-temperature cycling solution with TEC
  • Rich Accessories

    Low maintenance costs like easy-replaceable MCBs
  • Cost-effective

    Convenient configuration & replacement of accessories, which significantly reduces the overall testing cost
  • Fully Match ATE Application Scenarios

    With powerful and flexible database management capabilities, it aids in the in-depth analysis of data for research and development purposes

Functions and Advantages

  • Multi-host Parallel Travel Control, More Flexible ATE Multi-threaded Task Processing

    It supports mixed parallel testing of different types of modules, and supports testing OSFP/QSFP-DD/QSFP112/QSFP56 modules
  • Scientific Design: Double-sided TEC+ Water Cooler to Achieve Stronger Temperature Circulation Efficiency

    Ramp time: ~2 min
    Temperature control range: -5°C~ +75°C
    Accurate temperature control: ±1°C
    Temperature test: DMI temperature of the module
    Power consumption of the module under test: 15W/module
    Number of modules under test: 4 QSFP-DD modules with parallel temperature control
  • Integrated Optical Port Error Analyzer (BERT), MCB, and TEC Temperature Cycle Control Unit

    It can be applied to the bit error performance and eye diagram quality test of 400G/800G optical modules in high and low temperature environments.
    It supports QSFP-DD, OSFP, QSFP112 and other optical module packaging forms.
  • Easy to Use & High Cost-Effectiveness

    Status monitoring of TEC, MCB connector, and crimping box
    Separable design of MCB, which can be easily replaced while mating cycles life expired
  • Accessories with Quick-Use Design: MCB, TEC Kit, Chiller, etc

800G Test Solution

Model

DUT

Quantity

MTP8104

400G/800G OSFP

4

400G/800G QSFP-DD

4


TX Specification

Type

Item

Description

Pattern Generator Specification

Output

Differential PAM4/NRZ

Quantity of DUT in Parallel

4

Terminal

AC Coupling

Output Impedance

100 Ω ± 10%

Pattern

PRBS 7/9/11/13/15/23/31. PRBS7~31Q

SSPRQ, JP03A, JP03B, LIN, Square wave, Custom Defined pattern, etc.

Symbol Data Rate [1] (GBaud) 

24.33/24.8832/25/25.78125/26.5625/27.89/27.95/28.05/28.125
/28.2/48.66/49.7664/51.5625/53.125/56/56.25/56.4

Frequency

±50 ppm (typical)

Output Amplitude (Differential)

750 mVp-p (typical) [2]

Rise Time [3] (20–80%) 

<10 ps (typical)

Fall Time [3] (20–80%) 

<10 ps (typical)

Random Jitter [4]

<350 fs (typical)


Trigger and Clock Specification

Clock Output Amplitude

>300 mVp-p

Output Type

AC Coupled, Single-ended

Div Ratio (Adjustable)

4/8/16/32

Trigger Output

Support independent clock output for each port

[1] Option can be added to support expansion the rates <48G.

[2] Net measurement value at the transmitter’s end, default pre-emphasis/de-emphasis parameters.

[3] Tested with 53.125 Gbps NRZ signal.

[4] Tested with/after Jitter separation.


RX Specification

Type

Item

Description

Error Detector Specification

Input

Differential PAM4 /NRZ

Terminal

AC Coupled

Input Impedance

100 Ω ±10%

Input Range (Differential) [1]

150 ~ 750 mVp-p (typical)

RSSI (Differential) [1]

150 mVp-p (typical)

Pattern

PRBS 7/9/11/13/15/23/31, PRBS7~31Q, SSPRQ

Symbol Rate (Gbaud) [2] 

24.33/24.8832/25/25.78125/26.5625/27.89/27.95/28.05/28.125
/28.2/48.66/49.7664/51.5625/53.125/56/56.25/56.4

Clock Mode

Built-in Clock Recovery

Sync

Auto Sync (Level/Phase)

[1] Excessively high output amplitude of the device under test may damage the receiver.

[2] Option can be added to support expansion the rates <48G.


Optical Transceiver Testing Specification

Type

Item

Description

TC Specification [1][2]

TC Mode

Contact TEC temperature control

TC Range

-5 ~+85 ℃ [3] 

Stability

±1 ℃ [4]

Accuracy

±0.1 ℃

Vcc Bias Tuner

BIAS Range

2.85~3.67 V

Step

1 mV[5]

[1]The TC efficiency might fluctuate due to factors such as the ambient temperature, the power consumption of various transceivers, the location of heat sources, and the output power of the chiller

[2]Due to condensation by long-term low temperature use, the inner space should be circulated with dry and clean air, and periodically heated for drying

[3]Test environment: Room temperature of 25℃, 15W module placed in a closed space to reduce heat exchange with outside; Feedbacked by DMI temperature

[4]Perform repeat measurements of the temperature difference between the set temperature and case temperature
[5] Measured in the Semight Laboratory test environment (constant temperature 25°C, constant load 12W)

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