PB6400 KGD Die Handler, KGD, wafer, die, UPH-Semight Instruments

Known Good Die

PB6400

SiC KGD Die Handler

Semight PB6400 KGD Die Handler can be mainly used for power chip Die-level dynamic and static test to implement the screening of chip performance indicators and improve the first pass yield of the module after packaging. The testers in the corresponding specifications can be configured by test items, test conditions and test parameters. According to customer requirements, can supports the customized development. The system supports a variety of chip packaging methods, such as blue tap, Waffle Pack and Tape &Reel.

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Features

Excellent Scalability
Modular design with loading
unloading and test stations
Dynamic, Static and UIS Tests
Static test 2000V/200A
Dynamic test 2000V/1500A
Multi-site Parallel Testing
Supports up to four independent test sites, each configurable with unique test conditions and parameters
Precision Temperature Control
Room temperature ~ 185 ℃,
accuracy＜±3°C, resolution: 0.1°C
Airtight Socket Design
Supports nitrogen gas for arcing protection with integrated pressure monitoring
6s AOI
Micro-scale visible defect inspection down to 12µm
High Throughput
Up to 900 UPH @ 1s test time for Known Good Die
Powerful Software
Supports data MAP and bin sorting
Enables local storage, database uploads, and EAP integration
Offers tiered permissions and multi-account management

Category	Parameter	Specification	Remark
Basic Parameters	Die Size	33mm-88mm
	Die Thickness	100-400μm
	P&P Accuracy	±30μm
Temperature System	Temperature Range	Room Temperature ~185℃
	Resolution	0.1℃
	Tolerance	≤±3℃
Vision Inspection System	Inspection Accuracy	≥12μm	Grayscale contrast ratio > 40
	Defect	Top/Bottom: Scratch, Dirt, Contamination, Burn Mark, Chipped, Defect
	Defect	Side: Chipped
Stability	MTBF	>168H
	MTBA	>2H
	MTTA	5 min
	MTTR	<30 min
	Drop Rate	≤0.01%	Due to P&P
	Fragmentation Rate	≤0.01%
	Probe Depth	≤2μm
	Drain Kelvin	≤2Ω	TiNiAg material
Efficiency	Single Die	≥500 UPH	Test time ≤1s
Efficiency	Dual Die	≥900 UPH	Test time ≤1s

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