Please enter search keywords!

Site Map

Site Map

Sampling Oscilloscope

DCA6201

30/50GHz Sampling Oscilloscope DCA6201


Designed for high-volume manufacturing test applications, the DCA6201 has excellent measurement accuracy comparable to industry-standard DCA oscilloscopes. The DCA6201 is designed for R&D and massive production test applications and supports NRZ/PAM4 signals testing. Optical channels include optical reference receivers for the common 20 to 53 GBaud rates, and can simultaneously support up to 4 channels of eye diagram testing.

Features

  • Efficient Measurement

    Supports simultaneous measurement of all channels and parallel measurement
  • Multiple Measurement Functions

    Meets the normal NRZ and PAM4 eye diagram test parameters
  • Automatic Test

    The remote command control mode is convenient and fast
  • Ensure Accurate Performance

    High performance ensures test consistency

Functions and Advantages

  • Integrated Multi-port Design

    Small size (about 1/4 of the traditional sampling oscilloscope), saves space;
    4 optical ports optional, which can test 4 optical eye diagrams at the same time.
    4 differential electrical ports optional, 30G BW, support AOC and other module electrical port parameter tests.
  • Calibrated Reference Receiver

    Comply with the industry frequency response tolerance, compared with the traditional industry standard sampling oscilloscope, the eye diagram shape consistency is very high.

    As shown in the figure, the NRZ eye diagram

  • Calibrated Reference Receiver

    Comply with the industry frequency response tolerance, compared with the traditional industry standard sampling oscilloscope, the eye diagram shape consistency is very high.
    As shown in the figure is the PAM4 eye diagram

Optical Channel Specifications


Item

Specification

DCA6201-B30

DCA6201-B50

Optical Channel Bandwidth[1]

30 GHz

50 GHz(IRC Option)

Fiber Input

50/125μm FC/UPC (single-mode/multi-mode)

Wavelength Range

800 ~ 1650 nm

Factory Calibrated Wavelength [2]

850/1310/1550 nm ±10 nm

Supports Various Data Rate According to Multi Standards (Filters)

 

25.78Gbps (25/50/100 Gb Ethernet)

26.56 Gbps (400 Gb Ethernet)

27.95 Gbps (OTU4)

28.05 Gbps (32×Fiber Channel)

26.5625 GBaud PAM4

28.9 GBaud PAM4

53.125 GBaud PAM4

53.125 GBaud NRZ

49.7664 GBaud NRZ (50G PON)

24.8832 GBaud NRZ (50G PON)

12.4416 GBaud NRZ (50G PON)

ADC Resolution

14 Bit

Measurement Consistency [3]

Average Power: ±0.1 dB

Extinction Ratio: ±0.3 dB

Mask Margin: ±5%

TDECQ(PAM4): ±0.5 dB

Max Input[4]

(Non-Destruction, Peak)

5 mW (+7 dBm)

Sensitivity and Linear Range [5][6]

NRZ: 0 ~ -8 dBm

PAM4: -1 ~ -7 dBm

Monitor Average Power Range

-20 dBm ~ +1 dBm

Average Power Monitor Accuracy[7]

Single-mode ±5% ±200 nW ±connector uncertainty

Multimode (characteristic) ± 10% ± 200 nW ± connector uncertainty

Input Return Loss

(FC/UPC)

>23 dB@850nm

>30 dB@1310nm

[1] Optical channel bandwidth define by optical power reduced by 3dB which is -3dBo bandwidth(-3dBo=-6dBe)

[2] Here the ±10 nm is the source optical wave length error

[3] This parameter is not used to describe instrument specification. It means the difference between test with ideal signal and the theoretical value. In real test scenario, the test consistency related to signal quality

[4] This value is from damage test by increasing the input optical power step by step (0.1dBm step). In real applications, due to the instability of the optical source, please be aware that not to keep the input optical signal power at+7dBm or above. It may cause the instruments performance reduction or even damage

[5] Sensitivity is not a part of instrument specifications. It is calculated from characteristic value of noise. It means the power value when influenced only by oscilloscope‘s noise floor, test with ideal eye diagram mask and the mask margin to be close to 0%. The minimal power value is also related to the quality of signal under test in real scenario

[6] It has difference with different signal(NRZ/PAM4,single-mode/multi-mode)

[7] Due to variations in mode-filling conditions, the measured power in multimode fiber will vary more than the measured power in single-mode fiber. For users needing the most accurate power measurements, use an optical power meter for multimode power measurements


Electrical Specifications


Item

Specification

Electrical Channel

 Bandwidth [1]

33 GHz

Input Signal Type

AC-coupled

Input Connector

1.85 mm female(Differential)

Dynamic Range of Input

500 mVpp

DC Accuracy

3 mV@typ.

RMS Noise

1.5 mV@typ.

ADC Resolution

14 Bit

Max Input Amplitude

±1 V

Impedance

50±10% Ω

[1] It's the electrical channel -3dBe bandwidth. It is measured by frequency sweeping after removal of test system(±uncertainty)

Software

DCA6201GUI

Software Introduction

  • DCA6201 Software Interface

    DCA6201 Sampling Oscilloscope Software

    Features eye diagram/template measurement functions, installed on a computer or other instruments with a PC host

Notes on previous versions

  • 1. 32-bit and 64-bit installers for A.06.03 and earlier versions (A.06.40 and later versions only support 64-bit operating systems)

  • 2. A.05.80 and earlier versions support 86100C connectivity (86100C must run version A.10.83)

  • 3. A.05.00 and higher supports Windows 7 and Windows 10.

  • 4. A.04.54 and earlier versions support Windows XP

System

● Windows 10 64-bit
● Windows 7 64-bit

Prerequisite

1. NET Framework
    DCA6201 software requires .NET Framework support, and .NET Framework needs to be version 4.0 or above.
2. USB Driver
    If the DCA6201 uses USB communication, the USB Driver needs to be installed
3. Please read the user manual carefully before using the instrument.

Supported Instruments

DCA6201

Resource Download

Name
Version
Release Date
Download
  • GUI
    V0.1.0
    2025-6-16
    Click to download
  • USB driver
    V1.0
    2023-3-31
    Click to download

Similar recommendation

High Speed Communication Test
High Speed Communication Test

High speed communication test plays an important role in the rapid development of big data, cloud computing, 5G communication and other markets.
Semight offers various of instruments for optical Transceiver/Component testing, including wide bandwidth sampling oscilloscope, NRZ/PAM4 bit error ratio tester , burst error ratio tester, fast wavelength meter, high precise source measure unit, 400G network analyzer ,optical power meter, optical attenuator, optical switch etc. We provide cost-effective, complete solutions for optical testing.

Details
Electronic Measurement
Electronic Measurement

The high-precision source measure units integrates the functions of voltage source, current source, voltmeter, ampere meter, and electronic load in one, which is widely used in high-precision IV test and measurement for various discrete components, photovoltaic, green energy, battery and other industries. Semight provides high-precision benchtop SMU and plug-in PXIe SMU of standard PXIe chassis, fully meeting the application of various test scenarios.

Details
Optical Chip Test
Optical Chip Test

Burn-in testing of laser is an important method to ensure the reliability of laser. Through the test of CoC or bare die, the early failure of laser caused by the defects in the process of laser production can be screened out in advance. Semight provides a complete solution from bare die to CoC, from high temperature(150℃ or higher) to low temperature (-40℃), with CoC automatic loading and unloading system, forming a complete test solution, Semight's laser chip burn-in/load/unload test system has been widely recognized by the market.

Details
Power Semiconductor Test
Power Semiconductor Test

The semiconductor front-end test is mainly used in the wafer processing to check whether the processing parameters of the wafer products meet the design requirements or there are defects affecting the yield after each step of the manufacturing process. The semiconductor back-end test equipment is mainly used after wafer processing to check whether the performance of the chip meets the requirements, which belongs to the electrical performance test. Semight provides solutions such as Wafer Level Burn In system and Known Good Die handler for SiC testing, offering the value to customer in test efficiency improvement and test cost reduction.

Details
Log in

Account number

Password

Register an account

Name

Please enter your name *

E-mail

Please enter your email address *

E-mail verfication code

Please enter your email verification code

Phone

Please enter your contact number

Password

Please enter your login password *

Confirm Password

Please enter your login password again *
Reset password

E-mail address

Please enter your email number *

E-mail verification code

Please enter your email verification code

New Password

Please enter your login password *

Confirm Password

Please enter your login password again *