Semiconductor Device Analyzer
SA8000
Semiconductor Device Analyzer
Semight SA8000 is a versatile, highly integrated semiconductor device analyzer designed for efficient and precise device characterization.
The system offers a comprehensive suite of measurement capabilities, including standard DC I-V and C-V characterization, as well as high-precision transient pulse testing. With its exceptional measurement stability and high data reproducibility, the SA8000 provides a thorough and reliable parameter analysis solution for even the most complex devices.
Features
A High-end Test Platform
Sub-fA current resolution
Ultra-low Current Detection
0.1 fA（10-16 A）current measurement resolution
Fully Integrated Multi-dimensional Testing Capabilities
Flexible combinations of DC IV, CV, and fast-pulse measurement units
No-code Quick Test Mode
Quick characterization of device curves or key parametersFunctions and Advantages
Full-function / High-precision Test and Measurement
HPSMU Source/Monitor Resolution （100nV/1fA）
SemiExpert Professional Software
Switch Matrix Support（Switch）
|
Module |
Module Name |
Slot Occupied |
Main Measurements |
Key Specifications |
| S2016C-SA |
High Power Source Measure Unit |
1 |
DC I-V Pulsed I-V |
Up to 200 V / 1 A (3 A Pulsed) Min 1 fA / 100 nV resolution |
| S2017C-SA |
High Resolution Source Measure Unit |
1 |
DC I-V Pulsed I-V |
Up to 200 V / 1 A Min 1 fA / 100 nV resolution Optional PSU 0.1 fA and IV/CV switching |
| Z4005C-SA |
Multi-Frequency Capacitance Measurement Unit |
2 |
AC Impedance C-V, C-f, C-t |
20 Hz to 10 MHz frequency range 40 V built-in DC bias |
| S3023P-SA |
Semiconductor Pulse Generator Unit |
2 |
2-Level/3-Level Pulse ALWG |
Up to ±40 V high voltage output Minimum Pulse Width 20 ns |
| S3033C-SA |
Waveform Generator and Fast Measurement Unit |
3 |
PG/Fast IV ALWG Transient Waveform Capture |
2 ns programmable resolution for waveform generation 500 MSa/s simultaneous high-speed measurement 20 V peak-to-peak output |
|
Category |
Application Tests |
| CMOS Transistor |
Id-Vg, Id-Vd, Vth, Breakdown, Capacitance, Self-heating reduction, etc. |
| Bipolar Junction Transistor (BJT) |
Ic-Vc, Diode, Gummel plot, Breakdown, hFE, Capacitance, etc. |
| Discrete Device |
Id-Vg, Id-Vd, Ic-Vc, Diode, etc. |
| Memory |
Vth, Capacitance, Endurance test, etc. |
| Power Device |
Pulsed Id-Vg, Pulsed Id-Vd, Breakdown, etc. |
| Nano Device | Resistance, Id-Vg, Id-Vd, Ic-Vc, etc. |
| Reliability Test | NBTI/PBTI, Charge pumping, Electromigration, Hot Carrier Injection, V-Ramp, J-Ramp, TDDB, etc. |
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