
Bit Error Ratio Tester
PBT3058
1.6T Benchtop Bit Error Ratio Tester
Features

Wide Data Rate Range
Range: 24.33 ~128 GBaud
Flexible Configuration
Flexible test unit replacement
Excellent Signal Quality
Fast rising and falling edges, low intrinsic jitter
Rich Test Code Types
Pattern: PRBS7~31, PRBS7Q~31Q, SSPRQ, JP03A, JP03B, LINEAR, Square Wave, Custom Defined PatternFunctions and Advantages

FEC Simulation
PreBER/PostBER Measurement
Real-time Data Monitoring
Real-time bit error monitoring
Historical Data Query
Historical data query|
Type |
Item |
PBT3058 |
|
Pattern Generator Specification |
Output |
Differential PAM4 / NRZ |
|
Terminal |
AC Coupling |
|
|
Impedance |
100Ω+/-10% |
|
|
Test Patterns |
PRBS7~31, PRBS7Q~31Q, SSPRQ, JP03A, JP03B, LINEAR, Square Wave, Custom Defined Pattern (128 bits) |
|
| Symbol Rate (GBaud) | 97.32/99.5328/100/103.125/106.25/112/112.2/112.5/ 112.8/113.4375/115.1/120/128 | |
|
Opt. EDR1 Symbol Rate (GBaud) |
24.33/24.8832/25/25.78125/26.5625/27.89/27.95/28.0 5/28.125/28.2/28.9/30 48.66/49.7664/51.5625/53.125/56/56.25/56.4/57.8/58/ 58.125/59.37/60 |
|
| Opt. EDR2 Symbol Rate (GBaud) | 32/64/128 | |
|
Frequency Accuracy |
±50 ppm (typical) |
|
|
Output Amplitude[1](Differential) |
1000 mVp-p |
|
|
Rise/Fall Time[2] (20–80%) |
<4.5 ps |
|
| Random Jitter[3] | ≤ 200 fs | |
|
MON CLK
|
Clock Output[4] Amplitude |
>200 mVp-p |
|
Terminal (Single-ended) |
AC Coupled; MMCX female connector |
|
|
Div Ratio(Adjustable) |
4/8/16/32/64/128[5] |
| Type | Item | PBT3058 |
|
Error Detector |
Input |
Differential PAM4 / NRZ[1] |
| Terminal | AC Coupling | |
|
Impedance |
100Ω+/-10% |
|
|
Input Range[2] (Differential) |
Max.1000 mVp-p |
|
|
Loss Threshold[3] (Differential) |
50 mVp-p |
|
|
Test Patterns |
PRBS7 - 31, PRBS7Q - 31Q |
|
|
Clock Mode |
Built-in Clock Recovery |
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