
Laser Diode Test
CT6201-DC
CoC Test System
Features

CoC and Probe Card Stay Attached
During the burn-in and testing process, the CoC and probe card stay attached to minimize damage caused by the probe to the CoC
Temperature Range
Standard: 25°C to 100°C
High Testing Efficiency
CoC testing time < 7.5s
Automatic Loading and Unloading Fixture
Holds up to 6 fishbone fixtures with one magazine
High Testing Accuracy
Threshold current repeatability: <±1%
Self-developed SMU
Integrating Semight self-developed precision SMU by default
Software Functions
All test results, statuses, and abnormal records are automatically saved to the database efficiently and traceable
| Items | Description |
| DUT | CoC |
| Fixture | Using same fixture with Semight CoC BI system |
|
- Standard 48 pcs chip long fixture - Standard 32 pcs chip short fixture | |
| Fixture Loading/Unloading | Automatic loading and unloading fixture |
| Fixture ID Scan | Automatic Fixture Barcode scanning |
| Parallel Testing | CoC fixture double side parallel test |
| Standard Sample Control | The software supports standard sample management functions. If a standard sample is tested on the current system beyond the configured time period, the system will automatically generate an alert. |
| System Management | The software supports test system management functions. If the same fixture is used under testing on different test system before and after burn-in, the system will automatically generate an alert. |
| Test Configuration Control |
The software supports test configuration management and control, including test instrument, test algorithm, test sequence, test result judgment, etc. |
| Test Data | Supports customer customization and MES-related requirements |
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