Semight PXIe source measure unit (SMU) integrates high-precision source and measure units, and can use PXIe source measure unit to build a high-density parallel test system to meet the hig
From April 7th to 9th, 2023, the 11th China Electronic Information Expo (CITE2023) will be held at the Shenzhen Convention and Exhibition Center (Futian). As a national level platform to showcase the
At the beginning of the new year, ChatGPT is popular all over the world, triggering the demand for higher computing power. Cloud infrastructure, switches, optical communications, data centers, and tel
In March of Spring breeze, Semight invites you to attend the summit of MEMS fieldAnd the fourth China MEMS Manufacturing Conference and Micro and Nano Manufacturing and Sensor ExhibitionOur
The 48th Optical Networking and Communication Symposium and Expo (OFC) will be held at the San Diego Convention and Exhibition Center in California, USA. Suzhou Semight Co., Ltd. will displ
Semiconductor lasers are usually screened according to the changes of one or more key operating parameters measured before burn-in (Pre Burn In) and after burn-in (Post Burn In) to eliminate early failure
Semiconductor laser is the core device of optical transceiver module, and its stability directly affects the product quality of the module. CoC burn-in test is an effective screening method to eliminate the failure of early CoC products. By controlling th
CoC (Chip on Carrier)/CoS (Chip on Sub mount) architecture has become a popular packaging style for diodes/lasers. CoC usually uses customized waffle packs or Gel Paks for transportation and storage, and flows in different processes such as testing and bu