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Silicon Photonics

sCT9002

SiPh Wafer Test System


Semight sCT9002 has been fully optimized and integrated with hardware and software systems, showing significant improvements in optical alignment capability and coupling speed. The overall system adopts a modular design, with optical coupling options for fiber or fiber arrays, supporting vertical and edge coupling, and parallel testing significantly shortens testing time, effectively improving testing efficiency. The high precision and high reliability of the sCT9002 measurement results ensure the research and production of silicon photonic wafers.


Features

  • Automatic/Semi-automatic

    Supports automatic and semi-automatic wafer loading and unloading
    Compatible with 12-inch and 8-inch wafers
    Wafer thickness 200μm - 2000μm
  • Edge Coupling

    Real-time monitoring of height using nano displacement sensors to reduce the risk of damaging optical fibers
    High-precision vision system, reducing errors caused by small angles
  • Vertical Coupling

    Alignment of wafer level grating couplers using vertical coupling method
    Supports spiral scanning and gradient scanning (coupling time <1.5 s)
  • Automated Fiber Calibration

    Automated calibration script, angle calibration of the fiber array can be completed within 3mins
  • Modular Platform Software

    Supports Notch Up/Down continuous testing, no need to reload wafer, saving testing time
    Integrates most of the current silicon photonic wafer testing items cover O/O, E/E and O/E testing
  • Self-developed SMU

    High-precision 12-channel card-type SMU, high integration, saving machine space
    ±10 V, 50mA, the range perfectly covers the silicon light testing requirements
  • Equipped with a Height Sensor

    Solves the flatness variation issue of the wafer on the chuck
  • Test Temperature Range

    Room temperature 25°~150°
    (other temperatures can be customized)

Functions and Avantages

  • System Architecture

    sCT9002 SiPh Wafer Test System can achieve automated wafer loading. The loaded wafers can be rotated and positioned on the stage and the testing temperature can be adjusted according to testing requirements. The active optical alignment system and electrical probes couple/connect the optoelectronic signals to the testing instruments, completing the wafer testing.

  • Automatic Wafer Handling

    The wafer loading mode can choose between fully automatic mode or semi-automatic mode. The semi-automatic mode is suitable for laboratory verification to save investment costs; the fully automatic mode is suitable for large-scale mass production to improve production efficiency.


Specification


CHUCK

Platform

Material

Cast iron

Chuck X&Y Axis

Motor type

Servo motor

Travel range X*Y

≥340 mm * 490 mm

Resolution

0.1 μm

Positioning accuracy

±2 μm

Max speed

300 mm/s

Chuck Z Axis

Motor type

Stepper motor

Travel range

80 mm

Resolution

0.2 μm

Positioning accuracy

±2 μm

Max speed

30 mm/s

Chuck θ Axis

Motor type

Stepper motor

Travel range

±5°

Resolution

0.0000191°


Coupled

Module

Motion and positioning  

Hexapods + Piezo

6 serial axis +Piezo

Max number of active axes  

9

9

Rotation for roll, yaw and pitch

Automated

Automated

Stepping for X, Y, Z

Automated

Automated

Rough Positioning

Travel range X,Y,Z

±17, ±15, ±7 mm

±15, ±15, ±10 mm

Travel range θX, θY, θZ

±9, ±8.5, ±18°

±6, ±5, ±6°

Minimum incremental motion X, Y, Z

±0.10, ±0.10, ±0.05 μm

±0.10, ±0.10, ±0.10 μm

Minimum incremental motion θx, θy, θz

0.05mdeg,

0.05mdeg,

0.1mdeg

0.01deg,

0.01deg,

0.01deg

Fine Positioning

Travel range in X, Y, Z, closed loop  

80 μm

Min. incremental motion, open-loop  

0.4 nm

Min. incremental motion, closed-loop

4 nm

Alignment Speed

Scanning time of spiraled area scan

<1.5 s

Note

For vertical coupling only, purchasing the 8-axis system is sufficient.

To be compatible with both vertical and edge coupling, the 9-axis system is required


Coupling Specification

Optical coupling speed

  <1.5 s @ unilateral coupling

Coupling repeatability

<0.2 dB (30 times)

Optical power stability

<0.2 dB @ 5 min

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