
Silicon Photonics
sCT9002
SiPh Wafer Test System
Features

Automatic/Semi-automatic
Supports automatic and semi-automatic wafer loading and unloading
Edge Coupling
Real-time monitoring of height using nano displacement sensors to reduce the risk of damaging optical fibers
Vertical Coupling
Alignment of wafer level grating couplers using vertical coupling method
Automated Fiber Calibration
Automated calibration script, angle calibration of the fiber array can be completed within 3mins
Modular Platform Software
Supports Notch Up/Down continuous testing, no need to reload wafer, saving testing time
Self-developed SMU
High-precision 12-channel card-type SMU, high integration, saving machine space
Equipped with a Height Sensor
Solves the flatness variation issue of the wafer on the chuck
Test Temperature Range
Room temperature 25°~150°Functions and Avantages

System Architecture
sCT9002 SiPh Wafer Test System can achieve automated wafer loading. The loaded wafers can be rotated and positioned on the stage and the testing temperature can be adjusted according to testing requirements. The active optical alignment system and electrical probes couple/connect the optoelectronic signals to the testing instruments, completing the wafer testing.

Automatic Wafer Handling
The wafer loading mode can choose between fully automatic mode or semi-automatic mode. The semi-automatic mode is suitable for laboratory verification to save investment costs; the fully automatic mode is suitable for large-scale mass production to improve production efficiency.
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CHUCK |
Platform |
Material |
Cast iron |
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Chuck X&Y Axis |
Motor type |
Servo motor |
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Travel range X*Y |
≥340 mm * 490 mm |
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Resolution |
0.1 μm |
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Positioning accuracy |
±2 μm |
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Max speed |
300 mm/s |
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Chuck Z Axis |
Motor type |
Stepper motor |
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|
Travel range |
80 mm |
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Resolution |
0.2 μm |
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Positioning accuracy |
±2 μm |
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Max speed |
30 mm/s |
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Chuck θ Axis |
Motor type |
Stepper motor |
|
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Travel range |
±5° |
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Resolution |
0.0000191° |
|
Coupled Module |
Motion and positioning |
Hexapods + Piezo |
6 serial axis +Piezo |
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Max number of active axes |
9 |
9 |
|
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Rotation for roll, yaw and pitch |
Automated |
Automated |
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Stepping for X, Y, Z |
Automated |
Automated |
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Rough Positioning |
|||
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Travel range X,Y,Z |
±17, ±15, ±7 mm |
±15, ±15, ±10 mm |
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Travel range θX, θY, θZ |
±9, ±8.5, ±18° |
±6, ±5, ±6° |
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Minimum incremental motion X, Y, Z |
±0.10, ±0.10, ±0.05 μm |
±0.10, ±0.10, ±0.10 μm |
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Minimum incremental motion θx, θy, θz |
0.05mdeg, 0.05mdeg, 0.1mdeg |
0.01deg, 0.01deg, 0.01deg |
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Fine Positioning |
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Travel range in X, Y, Z, closed loop |
80 μm |
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Min. incremental motion, open-loop |
0.4 nm |
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Min. incremental motion, closed-loop |
4 nm |
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Alignment Speed |
|||
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Scanning time of spiraled area scan |
<1.5 s |
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Note |
For vertical coupling only, purchasing the 8-axis system is sufficient. To be compatible with both vertical and edge coupling, the 9-axis system is required |
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Coupling Specification |
Optical coupling speed |
<1.5 s @ unilateral coupling |
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Coupling repeatability |
<0.2 dB (30 times) |
|
|
Optical power stability |
<0.2 dB @ 5 min |
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