Amid ongoing semiconductor process innovation and the rapid expansion of green energy technologies, precision and efficiency in test equipment are crucial for driving industrial advancements and breakthroughs. Semight’s newly upgraded 12-channel PXIe SMU S2014C redefines testing capabilities in high-density integration and high dynamic response scenarios, featuring ultra-fine resolution of 1μV/1pA and a sampling rate of 1MS/s. This advancement accelerating innovation in the optical communication and semiconductor industries.

Performance Upgrade

Resolution up to 1μV/1pA
Voltage and current can be measured with resolutions as fine as 1 μV and 1 pA , allowing for precise capture of nA-level leakage currents and low-level signal fluctuations in ultra-low-power devices.

12-channel independent/synchronous control
It supports multi - channel parallel testing and able to simultaneously complete the IV characteristics testing of multiple devices or chip scanning, significantly improving test efficiency.

1MSa/s high-speed measurement

All 12 channels support a sampling rate of up to 1MSa/s, ensuring no transient signals are missed and enabling accurate recording with a millisecond level response.

10V/50mA wide dynamic coverage
From micro watt-level IoT chips to high-density integrated circuits, a single test card accommodates diverse voltage and current testing scenarios, reducing the need for frequent device switch

DC IV output capability

Flexible Modular Expansion
Based on the PXIe platform, it seamlessly integrates with various types of PXIe cards to form a fully automated testing system. By stacking multiple cards, it enables the integration of a hundred-channel source meter testing system.

Full-stack automation support
The system uses standard SCPI for control, and supports programming languages such as C#, Python, C/C++, LabVIEW, to seamlessly integrates into existing test platforms.

Typical application scenarios

Silicon Photonics Wafer Testing: Addressing Dark Current Challenges in High-Density Integrated Chips

In Silicon Photonics chip manufacturing, precise measurement of nA-level dark current is crucial for determining device performance and yield. The S2014C, with a resolution of 1 pA, can stably capture ultra-low dark current signals. Coupled with a 12-channel parallel architecture, it supports wafer-level multi-probe synchronous testing, achieving comprehensive analysis of parameters such as leakage current and responsivity in Silicon Photonics devices. This ensures the reliability for 800G optical modules and LiDAR chips!

Silicon Photonics Wafer-Level Multi-Probe Synchronous Testing

Battery Research & Development and Quality Inspection: Enabling Full-Cycle Support from Materials to Battery Packs

The charging/discharging curves, cycle life, and other key indicators of green energy batteries rely on high-precision Source Measure Unit (SMU) modules. A 1 MSa/s sampling rate enables real-time capture of transient phenomena such as battery polarization and internal resistance changes. Additionally, multi-channel cell module self-discharge testing significantly shortens Battery Management System (BMS) verification cycles.

Multi-Channel Realization of Battery Cell Module Self-Discharge Testing

Summary：

The S2014C, with high precision and weak - signal testing as its core strengths, accurately capture millivolt - level and even microvolt - level signal changes, providing reliable data support for scientific research and industrial applications. From complex testing scenarios to stringent measurement requirements, it meets diverse testing demands with exceptional performance and stability.