On September 12, the 26th China International Optoelectronic Expo (CIOE 2025) successfully concluded at the Shenzhen World Exhibition & Convention Center. The event gathered cutting-edge technologies and innovative achievements from the global optoelectronics industry, serving as a premier platform for tracking industry trends.

Semight exhibited a range of high-end testing solutions that attracted significant attention from new and existing customers, including:

• 1.6T optical module testing
• 50G PON testing
• High-performance source meters
• Silicon photonics wafer testing systems
• Laser chip CoC Burn-in systems

1.6T and 50G PON Test Solutions

Semight’s 1.6T high-speed test solution emerged as a highlight of the event. This solution meets the testing requirements of next-generation data centers by supporting comprehensive physical layer testing for 800G/1.6T Ethernet, providing full capabilities for:

• High-speed signal integrity analysis
• FEC (Forward Error Correction) analysis
• Bit error rate (BER) verification

Throughout the expo, Semight’s booth maintained consistent foot traffic, with customers and visitors from around the world engaging in in-depth discussions with the company’s technical staff.

The 50G PON test system also drew considerable interest. With the rapid advancement of 5G-Advanced and F5.5G technologies, 50G PON places higher demands on testing and measurement. Semight’s end-to-end test solution offers reliable technical support for equipment manufacturers and operators. Live demonstrations showcased the solution's exceptional capabilities in test accuracy, system compatibility, and automated testing.

Silicon Photonics Wafer Testing and Chip Burn-in Systems

Semight’s silicon photonics wafer testing system garnered significant industry attention. Tailored to the unique characteristics of silicon photonics processes, this system delivers high-precision optical and electrical testing capabilities. It supports automated wafer loading/unloading and enables rapid optical coupling, which significantly improves testing efficiency and contributes to higher product yields. During the expo, numerous professional visitors discussed topics like DC test accuracy, coupling methods and algorithms, RF testing, and multi-process platform compatibility with Semight’s technical team.

The CoC Burn-in test system was another technical highlight. Specifically designed for semiconductor laser chip Burn-in testing, this system supports up to 8,448 standard power channels and maintains a heat sink temperature uniformity deviation of ≤±1.0°C (from 40–100°C). The Semight technical team held in-depth discussions with over 20 attendees, exchanging insights on temperature control and test repeatability.

High-Precision Source Meter Performance

The source meter display area featured a variety of products with different specifications, capturing significant attendee attention. Semight’s technical support engineers demonstrated measuring the IV (current-voltage) characteristics of power devices using high-precision source meters, such as the S2035H/S2036H.

The demonstration clearly showcased key performance metrics, including high-speed sampling and low-noise measurement. Particularly notable was the stable pA-level (picoampere) microcurrent output during testing, even in the complex on-site environment. These outstanding capabilities sparked strong interest and lively discussions among professional attendees.

Looking Ahead

CIOE 2025 has concluded, but the pace of innovation in optical communication technology will continue to accelerate. Through this expo, Semight fully demonstrated its technological strength in the high-end optoelectronic testing field, forged closer cooperative relationships with industry partners, and established a solid industry benchmark, especially in 1.6T optical module testing.

Looking ahead, the company will remain committed to the innovative R&D and quality enhancement of test and measurement technologies, providing strong support for the development of the optical communication industry.