Semight CR6256 is a compact, cost-effective and efficient benchtop high-speed signal clock recovery unit, which supports either Non-Return-to-Zero (NRZ) or Pulse Amplitude Modulation 4-level (PAM4) signals clock recovery at 24.33-56.25Gbaud.
The rBT3250 50G Burst Mode Bit Error Ratio Tester is a newly developed burst BER analyzer specifically designed for testing Optical Line Terminals (OLTs) in next-generation 25G/50G Passive Optical Network (PON) applications. Its purpose is to evaluate the
As the world's largest electronics and power supply chain event, PCIM Europe has a strong influence in the industry, and the exhibitions, technical forums, academic conferences,
Semight Insturments will showcase the latest semiconductor equipments including SiC KGD PB6600 test system, WLBI3800 Wafer-Level Burn-In system and WAT6300 High-Voltage Serial Parameter test system during the exhibition! Welcome!
Semight is going to showcase the latest SiC KGD test system PB6600, Wafer-Level Burn-In system WLBI3800, High-Voltage Serial Parameter Test System WAT6300 during the event.
On 25th April, the 3rd International Forum on Compound Semiconductors, jointly organised by the Taiwan Electronic Equipment Association (TEEA) and the College of Engineering of National Taiwan University (NTU), came to a successful conclusion at the Nanga