On December 12th, 2024, the highly anticipated ICCAD-Expo 2024 came to a successful conclusion. Spanning two days, the event lured in over 6,000 participants, among whom were experts, scholars and industry representatives hailing from both home and abroad. They congregated to behold the latest accomplishments and cutting-edge technological innovations within China's integrated circuit industry. The display of Semight attracted many professionals for communication, especially Parallel Parametric Test System WAT6600, Dual-Channel Precision SMU S2036H, and PXIe SMU, which were the most eye-catching ones among semiconductor parameter testing solutions.

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Parallel Parametric Test System WAT6600 

WAT6600 supports up to 48 pin configurations with Per-pin SMU and Per-pinPGU resource. Each pin can source and measure individual current or voltage by Per-pin SMU and generate fast, multi-level, high voltage pulse for advanced flash memory testing by per-pin PGU. The system also supports access to external instruments such as DVM, LCR, Signal Analyzer, etc. via 6 auxiliary input ports and is able to achieve high-precision measurements of voltage, capacitance, frequency, etc.

S2036H Dual-Channel Precision SMU

The Semight S2036H is a compact and cost-effective single-channel benchtop Source/ Measure Unit (SMUs), which has a wide range of voltage source ± 200V and current source ± 1A (DC) and ± 3A (pulse) functions, excellent accuracy, 6-and-a-half-bit display (minimum 1fA/100nV display resolution), and excellent color LCD graphical user interface (GUI).

PXIe SMU

The S0342C PXIe SMU is compact and cost-effective 4-Channel PXIe Source/ Measure Units (SMUs) with the capability to source and measure both voltage and current. They have Maximum ±30 V, ± 500 mA (DC/pulse) sourcing capability, supports conventional SMU SCPI commands for easy test code migration. It supports most of standards PXIe chassis, supports multi-card synchronization. These features improve efficiency and lower the cost of ownership when integrating the SMUs into systems for production test.

At the exhibition, various SMUs from Semight attracted the attention of many attendees. Among them, the High-precision SMU features a resolution of 1fA/100nV, which is not only remarkable in resolution but also features excellent performance parameters, extremely low noise levels, and outstanding linearity and stability. These characteristics altogether ensure its exceptional performance in the field of high-precision measurements. The compact and cost-effective PXIe SMU series from Semight, which utilizes PXIe platform technology to achieve a high-density, high-performance modular design, also received significant attention. Allowing users to configure testing systems more flexibly to meet multi-channel measurement needs, a single card can support up to 12 channels. In addition, the multi-card synchronization function provides strong support for large-scale parallel testing, greatly improving testing efficiency.

Our technicians explained in detail the core performance indicators of the WAT6600 Parallel Parametric Test System and the SiPh Wafer Test System from Semight on-site. We appreciate the trust and attention shown by some customers towards these devices, aiming to better meet the testing needs of our customers.

Semight made an appearance at ICCAD 2024, showcasing the company's comprehensive strength in technological research and development as well as market expansion. Moreover, Semight will continue to adhere to the development concept driven by innovation and constantly pursue technological breakthroughs.