01、Introduction

At the cutting edge of semiconductor device R&D, every breakthrough in materials and iteration in processes relies on precise and in-depth characterization of electrical properties. From traditional silicon-based devices to emerging memory and logic chips, and from micron-scale CMOS to atomic-scale two-dimensional materials, test instruments have always served as the bridge connecting the physical world with simulation models.

Today, we are officially launching the new-generation Semiconductor Device Analyzer SA8000. Built on an architecture with fully independent intellectual property rights, a high-end test platform that combines sub-femtoampere current resolution and modular, flexible expandability, designed to provide semiconductor R&D engineers worldwide with precise and efficient measurement solutions.

02、Product Benefits

Ultra-Low Current Detection

Leveraging years of expertise in the field of source/measure unit (SMU), the SA8000 achieves a current measurement resolution of 0.1 fA (10^-16 A). It can stably capture ultra-weak signals from devices such as memristors and quantum dots, providing reliable weak-signal measurement capabilities for cutting-edge research.

Fully Integrated Multi-Dimensional Testing Capabilities

Built on the PXIe architecture, the system supports up to 18 modules operating simultaneously, allowing for flexible combinations of DC IV, CV, and fast-pulse measurement units. Through high-speed bus communication and unified synchronized trigger management, it is compatible with a wide variety of PXIe instruments. Eliminating the need to repeatedly switch between multiple instruments, the system significantly improves test efficiency and data consistency.

Quick Test Mode – No Programming Required

Classic Test Mode: Supports flexible and diverse parameter configurations to meet the needs of various testing scenarios;

Application Test Mode: Provides a library of pre‑configured device algorithms for quick characterization of device curves or key parameters;

Sequence Test Mode: Supports the automatic sequential execution of test sequences composed of multiple Classic Test or Application Test tasks;

Custom Device Testing Algorithms

The device algorithms in Application Test Mode are programmed in Python and available for customers to customize. Users can define the device test procedures and parameter extraction algorithms to meet their specific research needs, significantly enhancing testing flexibility and algorithm reproducibility.

The main available modules are as follows:

03、Typical Applications

SA8000 is widely used in the R&D and testing of a broad range of semiconductor devices, covering both conventional devices and cutting-edge research fields:

Typical Applications in Cutting-Edge Fields:

1. Memristor and Neuromorphic Computing Research

With built-in waveform generation and fast measurement units with a minimum pulse width of 200 ns, enables real-time recording of the resistive switching process, providing high-fidelity raw data for brain-inspired computing chips.

2. 2D Material and Quantum Device Research

Benefiting from its ultra-low current measurement resolution of 0.1 fA, enables precise characterization of subtle conductance variations in 2D materials such as graphene and MoS₂, supporting research into the operating mechanisms of emerging devices including quantum dots.

04、Semight Instruments

We understand that using such high-precision instruments requires a certain level of expertise. Therefore, we provide:

Ready-to-use measurement software: Built-in test algorithms for common semiconductor devices to reduce your setup time.

Comprehensive application notes: Step-by-step guidance and data analysis recommendations for common measurement scenarios and issues.

Professional technical support: Our application engineering team stands ready to answer your specific questions regarding measurement configuration and data analysis.