Semight DCA6201 sampling oscilloscope is based on equivalent-time sampling technology to reconstruct eye diagram, enabling in higher accuracy and better cost effective measurement of high-speed optoelectronic digital signals. DCA6201 released a new upgrad
emight sincerely invites you to visit the three major exhibitions held in Shenzhen, Suzhou, and Nagoya, Japan. As a high-end instruments and equipment supplier in the testing and measurement industry, we have prepared high-precision source meters, silicon
The MTP8104 could monitor the bit error statistics of the module in real time and save the statistical results in chart or data formats for further in-depth analysis
The products exhibited by Semight, including silicon photonic wafer testing equipment sCT9001, wafer-level burn-in system WLBI3800, and packaging-level reliability testing equipment PLR0010, attracted by many industry professionals for discuss
CIOE is a leading exhibition for optoelectronics industry, covering optical communications, precision optics, lasers, smart manufacturing, and new display technology and so on.
At the SEMICON Show, we will showcase our cutting-edge solutions, including PB6600 SiC KGD Test System, WLBI3800 Wafer Level Burn-In System, and PLR0010 Package-Level Reliability Test Equipment.